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- EKRA patented vision system EVA™ (EKRA Vision Alignment) using two CCD
cameras: one dedicated to the stencil, one dedicated to the substrate
- Uniform LED light sources ensure
no “Hot Spots“ in field of view
- Two light sources for substrate:
Spot and diffused
- Programable light intensity ensuring the optimum contrast for best
fidcucial quality on all substrates
- Enables the system to see low contrast applications (e.g. Silver on
Ceramic, flex or glass)
- Ability to fully illuminate domed
- pads for most accurate alignment
- Up to 4 fiducials per board
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- Fiducial is recorded as a pixel map of the field of view
- Vision system matches viewed pixel map to taught pixel map
- Resolution can be changed to increase or decrease accuracy based on the
application
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- EVA 2 ½ D – inspection system (10
x 8 mm)
- “NEW” EVA 2 ½ D PLUS – inspection
system (17 x 14 mm)
- CMOS camera technology
- Double the speed of standard inspection systems
- “NEW” HSI High Speed – inspection
system (17 x 14 mm)
- CCD camera technology
- X6 high speed linear camera positioning system
up to 4 frames / s via linear motors
- Speeds equal to line scan technology but with full 2 ½ D capability
- High resolution camera system
“High - Res“
(resolution 8 µm per
pixel)
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- Patented System to perform Measurement Of:
- Stencil Aperture Clogging
- Paste Brick Area
- Wet Paste Bridging between Pads
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- Q: HOW is it done?
- A: Unique Lighting Technology
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- Simple program generation by teaching clean open apertures as the
reference (not pads)
- Large Field of View (8mm x 10mm) inspected in 0.9 seconds
- No guessing of aperture reductions to get to proper acceptance criteria.
- Overprinting of Pads (e.g. BGA’s) can be correctly inspected
- Full gray scale analysis of the actual paste itself under 2 lighting
conditions. High Confidence in
paste deposit quality.
- Competitor‘s systems:
- White pixel counters: How many
bright pixels in the pad before and after it is printed. Can be fooled by darker
plating/oxidation etc.
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